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The effect of reflected and secondary electrons on lithography with the scanning tunneling microscope

✍ Scribed by M.A. McCord; R.F.W. Pease

Book ID
118361971
Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
474 KB
Volume
181
Category
Article
ISSN
0039-6028

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In the present study we use the Scanning Wneling Microscope (STM) as an instrument to investigate the photovoltaic properties of semiconducting materials. The surfaces of the layered semiconductor WSe, were optically illuminated during the tunneling process. The resulting photo-induced tunneling cur