Photovoltaic characterization of WSe2 wi
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S. Akari; M. Ch. Lux-Steiner; K. GlΓΆckler; T. Schill; R. Heitkamp; B. Koslowski;
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Article
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1993
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John Wiley and Sons
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English
β 509 KB
In the present study we use the Scanning Wneling Microscope (STM) as an instrument to investigate the photovoltaic properties of semiconducting materials. The surfaces of the layered semiconductor WSe, were optically illuminated during the tunneling process. The resulting photo-induced tunneling cur