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The effect of profile-step counting time on the determination of crystal structure parameters by X-ray Rietveld analysis

✍ Scribed by Hill, R. J. ;Madsen, I. C.


Book ID
114499665
Publisher
International Union of Crystallography
Year
1984
Tongue
English
Weight
906 KB
Volume
17
Category
Article
ISSN
0021-8898

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