The effect of profile step width on the determination of crystal structure parameters and estimated standard deviations by X-ray Rietveld analysis

✍ Scribed by Hill, R. J. ;Madsen, I. C.

• Book ID: 114499918
• Publisher: International Union of Crystallography
• Year: 1986
• Tongue: English
• Weight: 971 KB
• Volume: 19
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889886090076