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The effect of phosphorus incorporation on the dielectric constant and ionic conductivity of anodic tantalum oxide

✍ Scribed by J.J. Randall Jr.


Book ID
107748740
Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
501 KB
Volume
20
Category
Article
ISSN
0013-4686

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πŸ“œ SIMILAR VOLUMES


Migration of incorporated phosphorus in
✍ Fumihiro Arifuku; Hiroshi Yoneyama; Hideo Tamura πŸ“‚ Article πŸ“… 1979 πŸ› Elsevier Science 🌐 English βš– 337 KB

Almbxct -The mobility of phosphorus incorporated as a mass marker into tantalum anodic oxide films was investigetcd by mtans of ion microprobe mass analysis. If the transport number of tantalum ions for the film formation is ~ssumcd to be CotMant regardless of the oxidation current density chosen, t