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The effect of nitrogen on the microstructure, stress, and magnetic properties of RF-sputtered FeSiAl(N) thin films

✍ Scribed by J.E Snyder; C.C.H Lo; R Chen; B Kriegermeier-Sutton; J Leib; S.J Lee; M.J Kramer; D.C Jiles; M.T Kief

No coin nor oath required. For personal study only.

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