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The effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET's

✍ Scribed by Degraeve, R.; Groeseneken, G.; De Wolf, I.; Maes, H.E.

Book ID: 114536855
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 253 KB
Volume: 44
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.585549

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