✦ LIBER ✦
Study on the relation between structure and hot carrier effect immunity for deep sub-micron grooved gate NMOSFET’S
✍ Scribed by Hongxia Ren; Xiaoju Zhang; Yue Hao; Donggang Xu
- Book ID
- 110626297
- Publisher
- SP Science Press
- Year
- 2003
- Tongue
- English
- Weight
- 447 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0217-9822
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