The economics of SEM and electron probe microanalysis (EPMA) in forensic science
β Scribed by R.H. Keeley
- Publisher
- Elsevier Science
- Year
- 1975
- Weight
- 172 KB
- Volume
- 5
- Category
- Article
- ISSN
- 0300-9432
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## Abstract When thin overlayers on a bulk material have to be analysed by EPMA (electron probe microanalysis) or AES (Auger electron spectroscopy), the signal obtained is enhanced by three factors: (i) backβscattering, (ii) characteristic xβrays induced in the bulk by the primary beam and (iii) co
## Abstract The aim of this work was development of electron probe microanalysis (EPMA) technique suitable for composition determination of nanoscale layers. Proposed technique allows to determine the content of thin layers lying beneath the surface including single quantum wells (SQWs). The method