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Depth Profile Analysis on the Nanometer Scale by a Combination of Electron Probe Microanalysis (EPMA) and Focused Ion Beam Specimen Preparation (FIB)
✍ Scribed by B�ckins, Matthias ;Aretz, Anke ;Richter, Silvia ;Kyrsta, Stepan ;Sp�hn, Michael ;Mayer, Joachim
- Publisher
- Springer-Verlag
- Year
- 2004
- Weight
- 194 KB
- Volume
- 145
- Category
- Article
- ISSN
- 0344-838X
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