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The Dresden EBIT: An ion source for materials research and technological applications of low-energy highly charged ions

✍ Scribed by T. Werner; G. Zschornack; F. Grossmann; V.P. Ovsyannikov; F. Ullmann

Book ID
114164820
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
191 KB
Volume
178
Category
Article
ISSN
0168-583X

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## Abstract Highly charged ions significantly differ in their physical properties compared to “classical” low charged ions. With the Dresden EBIT/EBIS family (EBIT: Electron Beam Ion Trap, EBIS: Electron Beam Ion Source) a compact, economic and long‐term stable source setup for highly charged ions

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