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The double layer impedance as a probe of surface roughness

✍ Scribed by Michael Leibig; Thomas C. Halsey

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 411 KB
Volume: 38
Category: Article
ISSN: 0013-4686
DOI: 10.1016/0013-4686(93)80328-w

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