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The direct observation of electrical leakage paths due to crystal defects by use of the scanning electron microscope

✍ Scribed by I.G. Davies; K.A. Hughes; D.V. Sulway; P.R. Thornton

Publisher: Elsevier Science
Year: 1966
Tongue: English
Weight: 552 KB
Volume: 9
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(66)90112-2

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