✦ LIBER ✦

The determination of sulfur-ion-implantation profiles in GaAs using Auger electron spectroscopy

✍ Scribed by Y. S. Park; J. T. Grant; T. W. Haas

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

The determination of sulphur ion-implana

📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 162 KB

The determination of surface composition

✍ R. A. Chappell; C. T. H. Stoddart 📂 Article 📅 1977 🏛 Springer 🌐 English ⚖ 692 KB

The determination of composition depth p

✍ V. Thompson; H.E. Hintermann; L. Chollet 📂 Article 📅 1979 🏛 Elsevier Science ⚖ 420 KB

In-depth profiles of phosphorus ion-impl

✍ J.M. Morabito; J.C. Tsai 📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 277 KB

Improved accuracy in concentration profi

✍ J.F. Smith; H.N. Southworth 📂 Article 📅 1984 🏛 Elsevier Science ⚖ 87 KB

Measurement of the damage profile of ion

✍ M Gal; M.C Wengler; S Ilyas; I Rofii; H.H Tan; C Jagadish 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 117 KB