𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Improved accuracy in concentration profile determination by means of Auger electron spectroscopy

✍ Scribed by J.F. Smith; H.N. Southworth


Publisher
Elsevier Science
Year
1984
Weight
87 KB
Volume
21
Category
Article
ISSN
0376-4583

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


In-depth composition profile of anodic o
✍ S. Matsuzawa; N. Baba; S. Tajima πŸ“‚ Article πŸ“… 1979 πŸ› Elsevier Science 🌐 English βš– 286 KB

In-depth composition profiles of the an&c oxide films grown on Al (1 I1 ), (I 10) and (100) single crystal electrodes in ammonium borate were studied by Auger electron spectroscopy with Ar ion etching. The oxide film had the composition of Ai,O, as referenced to an authentic a-Al,O, single crystal.

Determination of the Ion Sputtering-indu
✍ Konkol, A.; Menyhard, M. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 243 KB πŸ‘ 2 views

Elastic peak depth proÐling was carried out on an Mo/Si multilayer system using a rotating specimen, grazing angle of incidence (86Γ„ with respect to the surface normal) and 0.5 keV Ar ion energy. The depth proÐling was simulated by dynamic TRIM (T-DYN) code. The T-DYN code provided the in-depth dist