The dependence of barrier height on temperature for Pd Schottky contacts on ZnO
β Scribed by W. Mtangi; F.D. Auret; C. Nyamhere; P.J. Janse van Rensburg; A. Chawanda; M. Diale; J.M. Nel; W.E. Meyer
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 261 KB
- Volume
- 404
- Category
- Article
- ISSN
- 0921-4526
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π SIMILAR VOLUMES
Temperature dependent current-voltage Γ°I2VΓ and Hall measurements were performed on Pd/ZnO Schottky barrier diodes in the range 20-300 K. The apparent Richardson constant was found to be 8:60 Γ 10 Γ9 A K Γ2 cm Γ2 in the 60-160 K temperature range, and mean barrier height of 0.50 eV in the 180-300 K
In this work, barrier height inhomogeneity and its origin are investigated for Au and Cu/n-InP metal/ semiconductor contacts. The effective barrier height values of the Au and Cu/n-InP Schottky barrier diodes (SBDs) have been obtained as 0.480 and 0.404 eV from current-voltage (I-V) characteristics