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The characterization of wafer surfaces and interfaces using high-frequency phonons

✍ Scribed by Hamid Bin Rani; S. C. Edwards; J. K. Wigmore; R. A. Collins

Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
433 KB
Volume
14
Category
Article
ISSN
0142-2421

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Experiments have shown that ultrafast optical excitation of semiconductors can produce oscillating changes in the optical properties of the material. The frequency of the oscillations in transmission or reflection usually matches one of the phonon modes, typically the q = 0 optical mode. These oscil