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Temperature and frequency characterization of InAs nanowire and HfO2 interface using capacitance–voltage method

✍ Scribed by Gvidas Astromskas; Kristian Storm; Philippe Caroff; Magnus Borgström; Erik Lind; Lars-Erik Wernersson


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
314 KB
Volume
88
Category
Article
ISSN
0167-9317

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