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The characteristics of CMOS devices in oxygen-implanted silicon-on-insulator structures

✍ Scribed by Mao, B.-Y.; Sundaresan, R.; Chen, C.-E.D.; Matloubain, M.; Pollack, G.


Book ID
114535490
Publisher
IEEE
Year
1988
Tongue
English
Weight
609 KB
Volume
35
Category
Article
ISSN
0018-9383

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