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The characteristic of acel in ZnS:Er3+ thin films grown by atomic layer epitaxy method(ALE)

✍ Scribed by Lijian Meng; G.Z. Zhong

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 387 KB
Volume: 40-41
Category: Article
ISSN: 0022-2313
DOI: 10.1016/0022-2313(88)90438-3

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