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X-ray diffraction study of microstructure in ZnS thin films grown from zinc acetate by atomic layer epitaxy

โœ Scribed by M. Oikkonen; M. Blomberg; T. Tuomi; M. Tammenmaa


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
235 KB
Volume
124
Category
Article
ISSN
0040-6090

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