Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is it
The Boundary-Scan Handbook: Analog and Digital
โ Scribed by Kenneth P. Parker
- Year
- 1998
- Tongue
- English
- Leaves
- 315
- Edition
- 2nd
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards. The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs). The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termedAnalog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future.
โฆ Table of Contents
Preliminaries......Page 1
TABLE OF CONTENTS......Page 8
List of Figures......Page 14
List of Table......Page 19
List of Design-for-Test Rules......Page 20
Preface to the First Edition......Page 22
Preface to the Second Edition......Page 24
Acknowledgement......Page 26
1 Boundary-Scan Basics and Vocabulary......Page 28
2 Boundary-Scan Description Language (BSDL)......Page 76
3 Boundary-Scan Testing......Page 132
4 Advanced Boundary-Scan Topics......Page 172
5 Design for Boundary-Scan Test......Page 194
6 Analog Measurement Basics......Page 224
7 IEEE 1149.4 Analog Boundary-Scan......Page 248
APPENDIX A: BSDL Syntax Specifications......Page 290
Bibliography......Page 302
Index......Page 308
๐ SIMILAR VOLUMES
<p>In February of 1990, the balloting process for the IEEE proposed standard P1149.1 was completed creating IEEE Std 1149.1-1990. Later that summer, in record time, the standard won ratification as an ANSI standard as well. This completed over six years of intensive cooperative effort by a diverse g
<p>Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the integrated circuit (IC) level that allow software to alleviate the growing cost of designing and producing digital systems. The primary benefit of the standard is its abilit
<p><div>Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of th
The Mixed-Signal Boundary-Scan Test Bus is the natural complement to the widely used Boundary-Scan IEEE Std. 1149.1, commonly known as JTAG. This new Mixed-Signal standard is called IEEE Standard 1149.4 and is mainly dedicated to the manufacturing test of analog and mixed-signal boards. But like the