IEEE Standard for Reduced-Pin and Enhanc
โ IEEE Test Technology Standards Committee
๐ Library
๐
2022
๐ IEEE
๐ English
โฆ LIBER โฆ
๐
The Test access port and boundary-scan architecture
โ Scribed by Jeffrey Liker, David Meier
- Publisher
- IEEE Computer Society Press
- Year
- 1991
- Tongue
- English
- Leaves
- 394
- Series
- IEEE Computer Society Press tutorial
- Category
- Library
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