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The Boundary-Scan Handbook

โœ Scribed by Kenneth P. Parker (auth.)

Publisher
Springer International Publishing
Year
2016
Tongue
English
Leaves
581
Edition
4
Category
Library
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โœฆ Synopsis

Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book.

โœฆ Table of Contents

Front Matter....Pages i-xxxiv
Front Matter....Pages 1-1
Boundary-Scan Basics and Vocabulary....Pages 3-48
Boundary-Scan Description Language (BSDL)....Pages 49-107
Boundary-Scan Testing....Pages 109-148
Advanced Boundary-Scan Topics....Pages 149-169
Design for Boundary-Scan Test....Pages 171-201
Analog Measurement Basics....Pages 203-226
IEEE 1149.4: Analog Boundary-Scan....Pages 227-267
IEEE 1149.6: Testing Advanced I/O....Pages 269-320
IEEE 1532: In-System Configuration....Pages 321-342
IEEE 1149.8.1: Passive Components....Pages 343-378
Front Matter....Pages 379-380
IEEE 1149.1: The 2013 Revision....Pages 381-453
IEEE 1149.6: The 2015 Revision....Pages 455-490
Back Matter....Pages 491-552

โœฆ Subjects

Circuits and Systems; Processor Architectures; Semiconductors

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