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The behavior of Ni/Au contacts under rapid thermal annealing in GaN device structures

โœ Scribed by F. Huet; M-A. Di Forte-Poisson; M. Calligaro; J. Olivier; F. Wyczisk; J. Di Persio


Book ID
107457942
Publisher
Springer US
Year
1999
Tongue
English
Weight
144 KB
Volume
28
Category
Article
ISSN
0361-5235

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