Analysis of broadened X-ray diffraction
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N. Ji; J.L. Lebrun; J.M. Sprauel
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Article
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1990
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Elsevier Science
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English
β 544 KB
On the basis of the principle of Warren-Averbach X-ray diffraction profile analysis, an accurate and rapid method of broadened X-ray diffraction profile analysis characterized by the use of a Voigtlike function for profile fitting and by a new modellization of the real part of the Fourier coefficien