𝔖 Bobbio Scriptorium
✦   LIBER   ✦

The analysis of X-ray diffraction profiles from imperfect solids by an application of convolution relations

✍ Scribed by Nandi, R. K. ;Sen Gupta, S. P.


Book ID
111877759
Publisher
International Union of Crystallography
Year
1978
Tongue
English
Weight
382 KB
Volume
11
Category
Article
ISSN
0021-8898

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Analysis of broadened X-ray diffraction
✍ N. Ji; J.L. Lebrun; J.M. Sprauel πŸ“‚ Article πŸ“… 1990 πŸ› Elsevier Science 🌐 English βš– 544 KB

On the basis of the principle of Warren-Averbach X-ray diffraction profile analysis, an accurate and rapid method of broadened X-ray diffraction profile analysis characterized by the use of a Voigtlike function for profile fitting and by a new modellization of the real part of the Fourier coefficien