✦ LIBER ✦

Texture and secondary extinction measurements in AlTi stratified films by X-ray diffraction

✍ Scribed by I Tomov; M Adamik; PB Barna; V Yamakov

Book ID: 108390414
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 462 KB
Volume: 50
Category: Article
ISSN: 0042-207X
DOI: 10.1016/s0042-207x(98)00089-x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Secondary extinction in texture analysis

Secondary extinction in texture analysis by neutron diffraction

✍ Dr. A. Mücklich; Dr. P. Klimanek 📂 Article 📅 1988 🏛 John Wiley and Sons 🌐 English ⚖ 198 KB

Residual stress measurement in textured

Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction

✍ C.-H. Ma; J.-H. Huang; Haydn Chen 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 139 KB

Measurement and correction of secondary

Measurement and correction of secondary extinction in CaF2 by means of synchrotron X-ray diffraction data

✍ Höche, H. R. ;Schulz, H. ;Weber, H.-P. ;Belzner, A. ;Wolf, A. ;Wulf, R. 📂 Article 📅 1986 🏛 International Union of Crystallography 🌐 English ⚖ 551 KB

Secondary extinction and absolute struct

Secondary extinction and absolute structure factors in X-ray diffraction: determination by polarization variation

✍ Yelon, W. B. ;van Laar, B. 📂 Article 📅 1984 🏛 International Union of Crystallography 🌐 English ⚖ 340 KB

Rietveld Texture and Stress Analysis of

Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction

✍ Lutterotti, Luca; Matthies, Siegfried; Chateigner, Daniel; Ferrari, Sandro; Rico 📂 Article 📅 2002 🏛 Trans Tech Publications, Ltd. 🌐 English ⚖ 502 KB

Rapid qualitative phase analysis in high

Rapid qualitative phase analysis in highly textured thin films by x-ray diffraction

✍ Borgia, Cesare; Olliges, Sven; Spolenak, Ralph 📂 Article 📅 2008 🏛 American Institute of Physics 🌐 English ⚖ 753 KB