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Tests of two alternative methods for measuring specimen thickness in a transmission electron microscope

✍ Scribed by Y.-Y. Yang; R.F. Egerton


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
455 KB
Volume
26
Category
Article
ISSN
0968-4328

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## Abstract A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 Γ… is presented. This method is based on the observation of Kossel‐MΓΆllenstedt fringes in transmission electron microscopy. It differs from the classical Kossel‐MΓΆllenstedt method in electron diff