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Testing integrated circuits with a laser beam : R. E. McMahon. Proc. 21st Electronic Components Conf., Washington D.C., U.S.A., 10–12 May (1971), p. 412

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 109 KB
Volume: 10
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(71)90096-5

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