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Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs

โœ Scribed by Hanjun Jiang; Olleta, B.; Degang Chen; Geiger, R.L.


Book ID
114630641
Publisher
IEEE
Year
2007
Tongue
English
Weight
793 KB
Volume
56
Category
Article
ISSN
0018-9456

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