Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs

✍ Scribed by Hanjun Jiang; Olleta, B.; Degang Chen; Geiger, R.L.

• Book ID: 114630641
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 793 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2007.903621