A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations

✍ Scribed by Olleta, B.; Hanjun Jiang; Degang Chen; Geiger, R.L.

• Book ID: 114630206
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 805 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2006.873821