Testing of Precision DAC Using Low-Resolution ADC With Wobbling

✍ Scribed by Le Jin; Haggag, H.; Geiger, R.L.; Degang Chen

• Book ID: 114630823
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 277 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2007.911694