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Testing and optimizing ADC performance: a probabilistic approach

โœ Scribed by Giaquinto, N.; Savino, M.; Trotta, A.


Book ID
114543401
Publisher
IEEE
Year
1996
Tongue
English
Weight
685 KB
Volume
45
Category
Article
ISSN
0018-9456

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A novel data optimization test technique is presented which utilizes a BIST structure, an ADC model and histogram data to characterize embedded ADCs. A practical 8 bit ADC is modeled and then characterized using 20% less data points then conventional analysis with a 78% reduction in the amount of da