A data optimization test technique for c
โ
J. Raczkowycz; S. Allott; T. I. Pritchard
๐
Article
๐
1996
๐
Springer US
๐
English
โ 550 KB
A novel data optimization test technique is presented which utilizes a BIST structure, an ADC model and histogram data to characterize embedded ADCs. A practical 8 bit ADC is modeled and then characterized using 20% less data points then conventional analysis with a 78% reduction in the amount of da