✦ LIBER ✦

A probabilistic approach for testing large-scale integrated circuits

✍ Scribed by Shanker Singh; Vijendra Pal Singh

Publisher: Springer
Year: 1978
Tongue: English
Weight: 465 KB
Volume: 7
Category: Article
ISSN: 1573-7640
DOI: 10.1007/bf00991634

No coin nor oath required. For personal study only.

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