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Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testability

✍ Scribed by Christian Landrault; Pascal Nouet


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
515 KB
Volume
31
Category
Article
ISSN
0167-9317

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Design for e-beam testability β€” A demand
✍ K.D. Herrmann; E. Kubalek πŸ“‚ Article πŸ“… 1987 πŸ› Elsevier Science 🌐 English βš– 883 KB

Based on the trends in development of integrated circuits {IC) until the year 2000 it is shown that, presuming the present capability of electron beam test systems, in future an electron beam test {EBT) will not be practicable anymore. This is mainly due to long measurement times, large measurement