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Test-Volume Reduction in Systems-on-a-Chip Using Heterogeneous and Multilevel Compression Techniques

✍ Scribed by Lingappan, L.; Ravi, S.; Raghunathan, A.; Jha, N.K.; Chakradhar, S.T.

Book ID: 117907615
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 823 KB
Volume: 25
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2005.862735

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