๐”– Bobbio Scriptorium
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Test Generation for Mixed-Signal Devices Using Signal Flow Graphs

โœ Scribed by Rajesh Ramadoss; Michael L. Bushnell


Book ID
110262643
Publisher
Springer US
Year
1999
Tongue
English
Weight
143 KB
Volume
14
Category
Article
ISSN
0923-8174

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A general-purpose modular-based scan chain between the analog-digital boundary of a mixed analog/digital design is proposed. This general-purpose Design-For-Test methodology is oriented towards the test of the mixed-signal modules within the design. Implementing this structure improves the controlla