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A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI

✍ Scribed by Johan Verfaillie; Didier Haspeslagh


Publisher
Springer US
Year
1996
Tongue
English
Weight
424 KB
Volume
9
Category
Article
ISSN
0923-8174

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✦ Synopsis


A general-purpose modular-based scan chain between the analog-digital boundary of a mixed analog/digital design is proposed. This general-purpose Design-For-Test methodology is oriented towards the test of the mixed-signal modules within the design. Implementing this structure improves the controllability and observability of these modules and the reusability of the test software at a minimum cost.