𝔖 Bobbio Scriptorium
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On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages

✍ Scribed by Daniela De Venuto; Michael J. Ohletz


Book ID
110321481
Publisher
Springer US
Year
2001
Tongue
English
Weight
397 KB
Volume
17
Category
Article
ISSN
0923-8174

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