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Test Data Volume Comparison: Monolithic vs. Modular SoC Testing

โœ Scribed by Sinanoglu, O.; Marinissen, E.J.; Sehgal, A.; Fitzgerald, J.; Rearick, J.


Book ID
119807637
Publisher
IEEE
Year
2009
Tongue
English
Weight
244 KB
Volume
26
Category
Article
ISSN
0740-7475

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