𝔖 Bobbio Scriptorium
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Test Data Reduction

✍ Scribed by Ham, W.


Book ID
114655759
Publisher
IEEE
Year
1976
Tongue
English
Weight
905 KB
Volume
5
Category
Article
ISSN
0046-838X

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## Abstract We believe that reduction of the testing cost is becoming increasingly important as the size of VLSIs becomes larger. Moreover, as the structure of VLSIs becomes more complicated, test compaction, test compression, and test application time reduction for non‐stuck‐at faults, such as del

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Test data generation is one of the most technically challenging steps of testing software, but most commercial systems currently incorporate very little automation for this step. This paper presents results from a project that is trying to find ways to incorporate test data generation into practical