## Abstract We believe that reduction of the testing cost is becoming increasingly important as the size of VLSIs becomes larger. Moreover, as the structure of VLSIs becomes more complicated, test compaction, test compression, and test application time reduction for nonβstuckβat faults, such as del
β¦ LIBER β¦
Test Data Reduction
β Scribed by Ham, W.
- Book ID
- 114655759
- Publisher
- IEEE
- Year
- 1976
- Tongue
- English
- Weight
- 905 KB
- Volume
- 5
- Category
- Article
- ISSN
- 0046-838X
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