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Test consideration for nanometer-scale CMOS circuits

✍ Scribed by Kaushik Roy; Mak, T.M.; Cheng, K.-T.

Book ID: 119807220
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 125 KB
Volume: 23
Category: Article
ISSN: 0740-7475
DOI: 10.1109/mdt.2006.52

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