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Temperature effects on the depth profiling of alloys

✍ Scribed by A. Galdikas; L. Pranevičius; D. Katilius; C. Templier; J. Delafond; J.C. Desoyer

Book ID
108390484
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
181 KB
Volume
53
Category
Article
ISSN
0042-207X

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## Abstract Depth profiling analysis of passive films grown on the surface of two nickel‐based alloys (Inconel 600 and Hastelloy C4) in NaCl media was carried out using Auger electron spectroscopy (AES) and ion sputtering. Improvement to the sequential sputtering model of Hofmann (1976) should be p