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ToF-SIMS depth profiling of alumina scales formed on a FeCrAl high-temperature alloy

✍ Scribed by J. Engkvist; U. Bexell; T.M. Grehk; M. Olsson

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 116 KB
Volume: 231-232
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2004.03.141

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