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Temperature distribution in Si-MOSFETs studied by micro-Raman spectroscopy

✍ Scribed by Ostermeir, R.; Brunner, K.; Abstreiter, G.; Weber, W.


Book ID
114534553
Publisher
IEEE
Year
1992
Tongue
English
Weight
663 KB
Volume
39
Category
Article
ISSN
0018-9383

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