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Temperature-dependent small-signal and noise parameter measurements and modeling on InP HEMTs

✍ Scribed by Murti, M.R.; Laskar, J.; Nuttinck, S.; Yoo, S.; Raghavan, A.; Bergman, J.I.; Bautista, J.; Lai, R.; Grundbacher, R.; Barsky, M.; Chin, P.; Liu, P.H.

Book ID
114553956
Publisher
IEEE
Year
2000
Tongue
English
Weight
268 KB
Volume
48
Category
Article
ISSN
0018-9480

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