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Temperature dependent loss tangent measurement of polymers with contact resonance atomic force microscopy

✍ Scribed by Chakraborty, Ishita; Yablon, Dalia G.

Book ID
121815247
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
509 KB
Volume
55
Category
Article
ISSN
0032-3861

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The atomic force microscope (AFM) continues to fi nd increasing applications in nanoscale imaging, [ 1 ] metrology, [ 2 ] devices, [ 3 ] and manufacturing. [ 4 ] In these applications, tip size and shape critically affect the accuracy, resolution, and reliability of measurements and processes. [ 5 ]