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Measurement of Viscoelastic Loss Tangent with Contact Resonance Modes of Atomic Force Microscopy

โœ Scribed by Hurley, Donna C.; Campbell, Sara E.; Killgore, Jason P.; Cox, Lewis M.; Ding, Yifu

Book ID
126206033
Publisher
American Chemical Society
Year
2013
Tongue
English
Weight
701 KB
Volume
46
Category
Article
ISSN
0024-9297

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Continuous Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
โœ Jason P. Killgore; Roy H. Geiss; Donna C. Hurley ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 572 KB

The atomic force microscope (AFM) continues to fi nd increasing applications in nanoscale imaging, [ 1 ] metrology, [ 2 ] devices, [ 3 ] and manufacturing. [ 4 ] In these applications, tip size and shape critically affect the accuracy, resolution, and reliability of measurements and processes. [ 5 ]