Temperature-dependent dose rate effects in CMOS/SOS devices

✍ Scribed by Seidler, W.; Walters, D.; Florian, J.; Harper, H.; Lutjens, S.; Salazar, M.; Alexander, D.; Smith, A.; Heideman, B.; Self, T.; Ferguson, G.; Ovrebo, G.; Blomquist, S.; Blackburn, J.; Vanderwall, J.

• Book ID: 114554676
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 1024 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.317388