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Temperature dependence study of two-dimensional electron gas effect on the noise performance of high frequency field effect transistors

โœ Scribed by Feng, M.; Scherrer, D.; Kruse, J.; Apostolakis, P.J.; Middleton, J.R.


Book ID
118243394
Publisher
IEEE
Year
1995
Tongue
English
Weight
271 KB
Volume
16
Category
Article
ISSN
0741-3106

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